Analytic determination of the three-dimensional distribution of dislocations using synchrotron X-ray topography

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Synchrotron X-Ray Diffraction Topography of Semiconductor Heterostructures

7 VP T J üú û üŗ 4 J W VN»»S » û þĀŗ VS O ". . *Ć Ğ Ğ /,(Ą ðĞ Ć Ć ăāĂĚ ăÿüĚ Āú Ě þăüû Ě üŗ Preface " Jokainen tsäänssi on mahdollisuus! " – Matti Nykänen (Every chance is an opportunity) The work presented in this thesis was carried out in Optoelectronics Laboratory , of Electrical Engineering between 2003 and 2012. I want to express my sincere gratitude to Professor Harri Lipsanen for supervis...

Synchrotron radiation x-ray topography of crystallographic defects in GaN

Aalto University, P.O. Box 11000, FI-00076 Aalto www.aalto.fi Author Sakari Sintonen Name of the doctoral dissertation Synchrotron radiation x-ray topography of crystallographic defects in GaN Publisher School of Electrical Engineering Unit Department of Microand Nanosciences Series Aalto University publication series DOCTORAL DISSERTATIONS 187/2014 Field of research Nanotechnology Manuscript s...

assessment of the efficiency of s.p.g.c refineries using network dea

data envelopment analysis (dea) is a powerful tool for measuring relative efficiency of organizational units referred to as decision making units (dmus). in most cases dmus have network structures with internal linking activities. traditional dea models, however, consider dmus as black boxes with no regard to their linking activities and therefore do not provide decision makers with the reasons...

Three-dimensional Study of Compressed Gas Diffusion Layers using Synchrotron X-ray Imaging